Redraw Figs. 6–12, 6–13, and 6–15 for the p-channel case (n-type substrate).

Introductory Circuit Analysis (13th Edition)
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ISBN:9780133923605
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Redraw the figures for p channel case (n type substrate).
Field-Effect Transistors
283
Figure 6-15
Approximate
distributions
of charge,
electric field,
and electrostatic
V>>0
· E.
potential in
the ideal MOS
capacitor in
inversion. The
relative width
of the inverted
E;
EFs
E,
EFm
M
region is
exaggerated
for illustrative
purposes, but is
neglected in the
field and potential
diagrams. The
slopes of the band
edges reflect the
electric fields
in the gate
dielectric and the
Q (charge per
unit area)
Charge
Density
W
semiconductor
channel. The
product of the
perpendicular
electric field and
dielectric constant
(known as the
displacement) is
continuous across
the dielectric-
Electric
semiconductor
Field
interface if there
are no charges
at the interface,
according
to Maxwell's
boundary
conditions.
W
4V (x)
Electrostatic
Potential
Transcribed Image Text:Field-Effect Transistors 283 Figure 6-15 Approximate distributions of charge, electric field, and electrostatic V>>0 · E. potential in the ideal MOS capacitor in inversion. The relative width of the inverted E; EFs E, EFm M region is exaggerated for illustrative purposes, but is neglected in the field and potential diagrams. The slopes of the band edges reflect the electric fields in the gate dielectric and the Q (charge per unit area) Charge Density W semiconductor channel. The product of the perpendicular electric field and dielectric constant (known as the displacement) is continuous across the dielectric- Electric semiconductor Field interface if there are no charges at the interface, according to Maxwell's boundary conditions. W 4V (x) Electrostatic Potential
6.15 Redraw Figs. 6–12, 6–13, and 6–15 for the p-channel
case (n-type substrate).
Transcribed Image Text:6.15 Redraw Figs. 6–12, 6–13, and 6–15 for the p-channel case (n-type substrate).
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