Q2. The time to failure in hours of an electronic component subjected to an accelerated life test is shown below. To accelerate the failure test, the units were tested at an elevated temperature. 127 124 121 118 136 131 140 125 137 133 125 141 124 125 128 140 129 132 130 129 122 126 125 131 124 129 121 142 151 160 125 123 120 119 128 133 137 124 142 123 a. Develop a frequency histogram and use it to prepare a brief summary of the main features of the data. b. The specifications for this variable are 130 +/- 10. How well does the process output seem to satisfy those specifications?

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