Let X1,..., X25 be a random sample from N(µ1, V50) and Y1,., X20 be a random sample from N(µ2, V60). We want to test the hypothesis Ho : µ1 – µ2 = 13 Ha : µ1 – 12 # 13 Find the probability of detecting a shift (power) from µ1 – µ2 = 13 to µi – µ2 = 15 if we are willing 0 or

MATLAB: An Introduction with Applications
6th Edition
ISBN:9781119256830
Author:Amos Gilat
Publisher:Amos Gilat
Chapter1: Starting With Matlab
Section: Chapter Questions
Problem 1P
icon
Related questions
Question

Part b

a. Let X and Y be independent exponential random variables with parameters 0g and Oy, respectively.
Find the likelihood ratio test statistic A, based on X and Y, to test Ho: 0=20, against Ha: 0»#20y.
b. Let X1,..., X25 be a random sample from N(u1, V50) and Y1,..., X2o be a random sample from
N(u2, V60). We want to test the hypothesis
Но : Иі — н2 3D 13
На : И1
M2#13
Find the probability of detecting a shift (power) from µi – µ2 = 13 to µi – µ2
to accept a Type I error a = 0.05. Draw the supporting graphs to show Type I and Type II errors.
15 if we are willing
c. Let X1, X2,..., Xn be a random sample from N(0, o). Use the Neyman-Pearson lemma to find the
best critical region for testing Ho : o? = o?
Ha : o2 = o%, with o > o3.
d. Refer to question (c). Suppose we are testing
Но : о?
Н, : о2
= 4
16
If n =
15, find a numerical value of the best critical region of size a = 0.05. Compute the power of
this test.
Transcribed Image Text:a. Let X and Y be independent exponential random variables with parameters 0g and Oy, respectively. Find the likelihood ratio test statistic A, based on X and Y, to test Ho: 0=20, against Ha: 0»#20y. b. Let X1,..., X25 be a random sample from N(u1, V50) and Y1,..., X2o be a random sample from N(u2, V60). We want to test the hypothesis Но : Иі — н2 3D 13 На : И1 M2#13 Find the probability of detecting a shift (power) from µi – µ2 = 13 to µi – µ2 to accept a Type I error a = 0.05. Draw the supporting graphs to show Type I and Type II errors. 15 if we are willing c. Let X1, X2,..., Xn be a random sample from N(0, o). Use the Neyman-Pearson lemma to find the best critical region for testing Ho : o? = o? Ha : o2 = o%, with o > o3. d. Refer to question (c). Suppose we are testing Но : о? Н, : о2 = 4 16 If n = 15, find a numerical value of the best critical region of size a = 0.05. Compute the power of this test.
Expert Solution
Step 1

b.

From the given information,

n1=25σ1=50n2=20σ2=60

Hypotheses:

H0:μ1-μ2=13Ha:μ1-μ213

Given that 

α=0.05PReject H0|H0 is true=0.05PZ>z+PZ-z=0.051-PZz+1-PZz=0.052-2PZz=0.051-PZz=0.025     PZz=0.975PZz|μ1-μ2=13=0.975PZx¯1-x¯2-μ1-μ2σ12n1+σ22n2|μ1-μ2=13=0.975                                 PZx¯1-x¯2-135025+6020=0.975                                PZx¯1-x¯2-135=0.975, obtained from the excel function, =NORM.INV(0.975,0,1)                                             x¯1-x¯2-135=1.96                         x¯1-x¯2 = 17.3827   

 

 

steps

Step by step

Solved in 2 steps with 2 images

Blurred answer
Recommended textbooks for you
MATLAB: An Introduction with Applications
MATLAB: An Introduction with Applications
Statistics
ISBN:
9781119256830
Author:
Amos Gilat
Publisher:
John Wiley & Sons Inc
Probability and Statistics for Engineering and th…
Probability and Statistics for Engineering and th…
Statistics
ISBN:
9781305251809
Author:
Jay L. Devore
Publisher:
Cengage Learning
Statistics for The Behavioral Sciences (MindTap C…
Statistics for The Behavioral Sciences (MindTap C…
Statistics
ISBN:
9781305504912
Author:
Frederick J Gravetter, Larry B. Wallnau
Publisher:
Cengage Learning
Elementary Statistics: Picturing the World (7th E…
Elementary Statistics: Picturing the World (7th E…
Statistics
ISBN:
9780134683416
Author:
Ron Larson, Betsy Farber
Publisher:
PEARSON
The Basic Practice of Statistics
The Basic Practice of Statistics
Statistics
ISBN:
9781319042578
Author:
David S. Moore, William I. Notz, Michael A. Fligner
Publisher:
W. H. Freeman
Introduction to the Practice of Statistics
Introduction to the Practice of Statistics
Statistics
ISBN:
9781319013387
Author:
David S. Moore, George P. McCabe, Bruce A. Craig
Publisher:
W. H. Freeman