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HW1: If an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a=0.2000 nm) is measured using a conventional diffractometer, we will obtain six diffraction peaks corresponding to (110), (200), (211), (220), (310), and (222) planes. Compute the Lorentz-polarization factor using Cu-K, radiation Lamda=1.545 nm. Hint: make a table for indexing pattern analysis.

HW1: If an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a=0.2000 nm) is measured using a conventional diffractometer, we will obtain six diffraction peaks corresponding to (110), (200), (211), (220), (310), and (222) planes. Compute the Lorentz-polarization factor using Cu-K, radiation Lamda=1.545 nm. Hint: make a table for indexing pattern analysis.

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HW1: If an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a=0.2000 nm) is measured using a conventional diffractometer, we will obtain six diffraction peaks corresponding to (110), (200), (211), (220), (310), and (222) planes. Compute the Lorentz-polarization factor using Cu-K, radiation Lamda=1.545 nm. Hint: make a table for indexing pattern analysis.
Transcribed Image Text:HW1: If an X-ray diffraction pattern for a powder sample of Cr (crystal system: body-centered cubic and lattice parameter a=0.2000 nm) is measured using a conventional diffractometer, we will obtain six diffraction peaks corresponding to (110), (200), (211), (220), (310), and (222) planes. Compute the Lorentz-polarization factor using Cu-K, radiation Lamda=1.545 nm. Hint: make a table for indexing pattern analysis.
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