Given that resistors are produced in lots of 1000, and that the average defective resistors per lot is 12.7, what are the upper and lower limits for the p-chart used to control this process? A) [2.1; 23.3] B) [3.8; 21.6] C) [0.002; 0.023] D) [1.5; 16.7] Which of the following charts is used to monitor the average number of onconformities per unit when subgroup sizes are variable? ) moving range chart Ou-chart c-chart p-chart men the number of defects is extremely low: The c chart can be used effectively. The p chart can be designed to have a non-zero lower control limit. It is more efficient to monitor the time between defects. The np chart can be used to monitor the number of defects per unit. c-chart, if the average number of defects per inspection unit is 16, and the ction unit includes 36 items, the upper 3-sigma control limit is: 8.0 7.3 54 -0 f the following statements is NOT true? s always less than or equal to Cp. the ratio of specification width to process 6-sigma spread. pk value can be improved if the process can be centered. of 1.0 is better than a Cp of 1.2.
Given that resistors are produced in lots of 1000, and that the average defective resistors per lot is 12.7, what are the upper and lower limits for the p-chart used to control this process? A) [2.1; 23.3] B) [3.8; 21.6] C) [0.002; 0.023] D) [1.5; 16.7] Which of the following charts is used to monitor the average number of onconformities per unit when subgroup sizes are variable? ) moving range chart Ou-chart c-chart p-chart men the number of defects is extremely low: The c chart can be used effectively. The p chart can be designed to have a non-zero lower control limit. It is more efficient to monitor the time between defects. The np chart can be used to monitor the number of defects per unit. c-chart, if the average number of defects per inspection unit is 16, and the ction unit includes 36 items, the upper 3-sigma control limit is: 8.0 7.3 54 -0 f the following statements is NOT true? s always less than or equal to Cp. the ratio of specification width to process 6-sigma spread. pk value can be improved if the process can be centered. of 1.0 is better than a Cp of 1.2.
Mathematics For Machine Technology
8th Edition
ISBN:9781337798310
Author:Peterson, John.
Publisher:Peterson, John.
Chapter30: Customary And Metric Steel Rules
Section: Chapter Questions
Problem 9A: Read measurements on the enlarged fractional rule shown in Figure 30-12.
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![Given that resistors are produced in lots of 1000, and that the average
defective resistors per lot is 12.7, what are the upper and lower limits for the p-chart
used to control this process?
A) [2.1; 23.3]
B) [3.8; 21.6]
C) [0.002; 0.023]
D) [1.5; 16.7]
Which of the following charts is used to monitor the average number of
onconformities per unit when subgroup sizes are variable?
) moving range chart
Ou-chart
c-chart
p-chart
men the number of defects is extremely low:
The c chart can be used effectively.
The p chart can be designed to have a non-zero lower control limit.
It is more efficient to monitor the time between defects.
The np chart can be used to monitor the number of defects per unit.
c-chart, if the average number of defects per inspection unit is 16, and the
ction unit includes 36 items, the upper 3-sigma control limit is:
8.0
7.3
54
-0
f the following statements is NOT true?
s always less than or equal to Cp.
the ratio of specification width to process 6-sigma spread.
pk value can be improved if the process can be centered.
of 1.0 is better than a Cp of 1.2.](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2F3e1fa912-5e0c-4d6e-bcb6-bc3942e62084%2F91003f43-5a2f-4ad1-b2d4-65903505dba3%2Fukg8lb_processed.png&w=3840&q=75)
Transcribed Image Text:Given that resistors are produced in lots of 1000, and that the average
defective resistors per lot is 12.7, what are the upper and lower limits for the p-chart
used to control this process?
A) [2.1; 23.3]
B) [3.8; 21.6]
C) [0.002; 0.023]
D) [1.5; 16.7]
Which of the following charts is used to monitor the average number of
onconformities per unit when subgroup sizes are variable?
) moving range chart
Ou-chart
c-chart
p-chart
men the number of defects is extremely low:
The c chart can be used effectively.
The p chart can be designed to have a non-zero lower control limit.
It is more efficient to monitor the time between defects.
The np chart can be used to monitor the number of defects per unit.
c-chart, if the average number of defects per inspection unit is 16, and the
ction unit includes 36 items, the upper 3-sigma control limit is:
8.0
7.3
54
-0
f the following statements is NOT true?
s always less than or equal to Cp.
the ratio of specification width to process 6-sigma spread.
pk value can be improved if the process can be centered.
of 1.0 is better than a Cp of 1.2.
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