Figure A.3. These images were produced using the beam of an electron micro- scope. A positively charged wire was placed in the path of the beam, causing the electrons to bend around either side and interfere as if they had passed through a double slit. The current in the electron beam increases from one image to the next, showing that the interference pattern is built up from the statistically distributed light flashes of individual electrons. From P. G. Merli, G. F. Missiroli, and G. Pozzi, American Journal of Physics 44, 306 (1976).
Figure A.3. These images were produced using the beam of an electron micro- scope. A positively charged wire was placed in the path of the beam, causing the electrons to bend around either side and interfere as if they had passed through a double slit. The current in the electron beam increases from one image to the next, showing that the interference pattern is built up from the statistically distributed light flashes of individual electrons. From P. G. Merli, G. F. Missiroli, and G. Pozzi, American Journal of Physics 44, 306 (1976).
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In the experiment shown in Figure A.3, the effective slit spacing was 6 μm and the distance from the "slits" to the detection screen was 16 cm. The spacing between the center of one bright line and the next (before magnification) was typically 100 nm. From these parameters, determine the wavelength of the electron beam. What voltage was used to accelerate the electrons?
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