The first prototype electron microscope, capable of four-hundred-power magnification, was developed in 1931 by the physicist Earnst Ruska and the electrical engineer Max Knoll.
In May of the same year, Reinhold Rudenberg, the scientific director of Siemens Schuckertwerke obtained a patent for an electron microscope. In 1932, Ernst Lubcke Siemens ans Halske built and obtained images from a prototype electron microscope, applying the concepts described in Rudenberg's patent.
electron microscope, that attains extremely high resolution using an electron beam instead of a beam of light to illuminate the object of study.
Electron microscope has three essential systems: (1) an electron gun, which produces the electron beam, and the condenser system, which focuses the beam onto the object, (2) the image-producing system, consisting of the objective lens, movable specimen stage, and intermediate and projector lenses, which focus the electrons passing through the specimen to form a real, highly magnified image, and (3) the image-recording system, which converts the electron image into some form perceptible to the human eye.The image-recording system usually consists of a fluorescent image for viewing and focusing the image and a digital camera for permanent records. In addition, a vacuum system, consisting of pumps and their associated gauges and valves, and power supplies are required.
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