CASELET 1 The results of a study conducted as part of a yield-improvement effort at a semiconductor manufacturing facility provided defect data for a sample of 450 wafers. The following contingency table presents a summary of the responses to two questions: "Was a particle found on the die that produced the wafer?" and "Is the wafer good or bad?" Use an alpha of 0.05. Quality of Wafer Bad Particles Good Totals Yes 14 36 50 No 320 80 400 Totals 334 116 450

Q: Solve for the value of x. P (3x + 10) (5x + 10) (4x + 25)

A: In given figure∠P+∠R=180°3x+10+5x+10=1808x=180-20x=1608x=20

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A: Distribute the 4

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A: We have to find value of p

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Q: 6x+2 -3x-2   < -4

A:

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A: