below. The output node F' has a parasitic capacitance 'Cout'. VDp MpB MpA орen F A MnA Cout B. MnB Assuming that this parasitic capacitance is storing the charge temporarily for finite time, discuss
below. The output node F' has a parasitic capacitance 'Cout'. VDp MpB MpA орen F A MnA Cout B. MnB Assuming that this parasitic capacitance is storing the charge temporarily for finite time, discuss
Introductory Circuit Analysis (13th Edition)
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![Q5. a) A gate is shown in the following diagram. An 'open' fault appears in this gate as shown
below. The output node F has a parasitic capacitance 'Cout'’.
Vpp
MpB
MpA
орen
F
А
MnA
Cout
B.
MnB
Assuming that this parasitic capacitance is storing the charge temporarily for finite time, discuss
how this storage could result in non-detection of this "open' fault. Also give the solution for this
non-detection if possible.](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2F231512b0-4db8-49c8-9d84-be8e4ccdb343%2F500ba8b8-55e6-44c6-9567-b4f15ee574b6%2F8azonr_processed.png&w=3840&q=75)
Transcribed Image Text:Q5. a) A gate is shown in the following diagram. An 'open' fault appears in this gate as shown
below. The output node F has a parasitic capacitance 'Cout'’.
Vpp
MpB
MpA
орen
F
А
MnA
Cout
B.
MnB
Assuming that this parasitic capacitance is storing the charge temporarily for finite time, discuss
how this storage could result in non-detection of this "open' fault. Also give the solution for this
non-detection if possible.
![b) The GOS fault shown in the following diagram would result in the malfunction of the FET.
Suppose the fault has occurred suddenly while the FET was in the active region of operation and
normal source, gate and drain voltages were applied and the FET was conducting perfectly prior
to the fault, discuss the transient and post transient response of this sudden fault on the operation
of the FET shown.
n-poly:
gate
Gate
n+
n+
GOS
p-substrate](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2F231512b0-4db8-49c8-9d84-be8e4ccdb343%2F500ba8b8-55e6-44c6-9567-b4f15ee574b6%2Fqae4b85_processed.png&w=3840&q=75)
Transcribed Image Text:b) The GOS fault shown in the following diagram would result in the malfunction of the FET.
Suppose the fault has occurred suddenly while the FET was in the active region of operation and
normal source, gate and drain voltages were applied and the FET was conducting perfectly prior
to the fault, discuss the transient and post transient response of this sudden fault on the operation
of the FET shown.
n-poly:
gate
Gate
n+
n+
GOS
p-substrate
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