An XPS with an instrument work function of 4.5eV was used to analyze a surface. An observed kinetic energy of 795.2 eV was observed when a(n) MgKα (1253.6 eV) X-ray source was used. What was the binding energy of the electron coming from this surface?
An XPS with an instrument work function of 4.5eV was used to analyze a surface. An observed kinetic energy of 795.2 eV was observed when a(n) MgKα (1253.6 eV) X-ray source was used. What was the binding energy of the electron coming from this surface?
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5. An XPS with an instrument work function of 4.5eV was used to analyze a surface. An observed kinetic energy of 795.2 eV was observed when a(n) MgKα (1253.6 eV) X-ray source was used. What was the binding energy of the electron coming from this surface?
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