An abrupt silicon pn junction at T = 300 K has impurity doping concentrations of Na = 5 X 1016 cm-3 and Na = 1015 cm-3. Calculate (a) Vbi, (b) W at (i) VR = 0 and (ii) VR = 5 V, and (c) |Emax | at (i) VR = 0 and (ii) VR = 5. 7.16 7.17 Consider the pn junction described in Problem 7.10 for T = 300 K. The cross-

Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
Chapter1: Introduction
Section: Chapter Questions
Problem 1P: Visit your local library (at school or home) and describe the extent to which it provides literature...
icon
Related questions
Question
Q7.16 only
7.15 Examine the electric field versus distance through a uniformly doped silicon pn junction
at T = 300 K as a function of doping concentrations. Assume zero applied bias. Sketch
the electric field versus distance through the space charge region and calculate |Emax|
for: (a) Na = 1017 cm-3 and 1014 < Na< 107 cm 3 and (b) Na = 1014 cm 3 and 1014 <
Na< 1017 cm 3. (c) What can be said about the results for Na 100 Na or Na 100 Na?
AV
Section 7.3 Reverse Applied Bias
7.16 An abrupt silicon pn junction at T = 300 K has impurity doping concentrations of
Na = 5 X 10'6 cm 3 and Na= 1015 cm-3. Calculate (a) Vi, (b) W at (i) VR = 0 and
(ii) VR = 5 V, and (c) |Emax | at (i) VR = 0 and (ii) VR = 5.
7.17 Consider the pn junction described in Problem 7.10 for T = 300 K. The cross-
sectional area of the junction is 2 X 10-4 cm? and the applied reverse-biased voltage is
VR = 2.5 V. Calculate (a) Vi, (b) Xn, Xp, W, (c) |Emaxl, and (d) the junction capacitance.
An ideal one-sided silicon pn junction at T = 300 K is uniformly doped on both
sides of the metallurgical junction. It is found that the doping relation is Na = 80 Na
and the built-in potential barrier is Vi = 0.740 V. A reverse-biased voltage of VR = 10 V
is applied. Determine (a) Na, Na; (b) Xp, Xn; (C) |Emax |; and (d) C.
A silicon n*p junction is biased at VR = 5 V. (a) Determine the change in built-in
potential barrier if the doping concentration in the p region increases by a factor of 3.
(b) Determine the ratio of junction capacitance when the acceptor doping is 3Na com-
pared to that when the acceptor doping is N.. (c) Why does the junction capacitance
increase when the doping concentration increases?
7.18
%3D
7.19
7.20 (a) The peak electric field in a reverse-biased silicon pn junction is [Emax| = 3 X 10 V/cm.
The doping concentrations are Na = 4 X 1015 cm 3 and Na = 4 X 1017 cm-3. Find the
magnitude of the reverse-biased voltage. (b) Repeat part (a) for Na = 4 × 1016 cm 3 and
%3D
1Y 1017 cm 3
Transcribed Image Text:7.15 Examine the electric field versus distance through a uniformly doped silicon pn junction at T = 300 K as a function of doping concentrations. Assume zero applied bias. Sketch the electric field versus distance through the space charge region and calculate |Emax| for: (a) Na = 1017 cm-3 and 1014 < Na< 107 cm 3 and (b) Na = 1014 cm 3 and 1014 < Na< 1017 cm 3. (c) What can be said about the results for Na 100 Na or Na 100 Na? AV Section 7.3 Reverse Applied Bias 7.16 An abrupt silicon pn junction at T = 300 K has impurity doping concentrations of Na = 5 X 10'6 cm 3 and Na= 1015 cm-3. Calculate (a) Vi, (b) W at (i) VR = 0 and (ii) VR = 5 V, and (c) |Emax | at (i) VR = 0 and (ii) VR = 5. 7.17 Consider the pn junction described in Problem 7.10 for T = 300 K. The cross- sectional area of the junction is 2 X 10-4 cm? and the applied reverse-biased voltage is VR = 2.5 V. Calculate (a) Vi, (b) Xn, Xp, W, (c) |Emaxl, and (d) the junction capacitance. An ideal one-sided silicon pn junction at T = 300 K is uniformly doped on both sides of the metallurgical junction. It is found that the doping relation is Na = 80 Na and the built-in potential barrier is Vi = 0.740 V. A reverse-biased voltage of VR = 10 V is applied. Determine (a) Na, Na; (b) Xp, Xn; (C) |Emax |; and (d) C. A silicon n*p junction is biased at VR = 5 V. (a) Determine the change in built-in potential barrier if the doping concentration in the p region increases by a factor of 3. (b) Determine the ratio of junction capacitance when the acceptor doping is 3Na com- pared to that when the acceptor doping is N.. (c) Why does the junction capacitance increase when the doping concentration increases? 7.18 %3D 7.19 7.20 (a) The peak electric field in a reverse-biased silicon pn junction is [Emax| = 3 X 10 V/cm. The doping concentrations are Na = 4 X 1015 cm 3 and Na = 4 X 1017 cm-3. Find the magnitude of the reverse-biased voltage. (b) Repeat part (a) for Na = 4 × 1016 cm 3 and %3D 1Y 1017 cm 3
Expert Solution
trending now

Trending now

This is a popular solution!

steps

Step by step

Solved in 3 steps with 2 images

Blurred answer
Knowledge Booster
Nodal analysis
Learn more about
Need a deep-dive on the concept behind this application? Look no further. Learn more about this topic, electrical-engineering and related others by exploring similar questions and additional content below.
Similar questions
Recommended textbooks for you
Introductory Circuit Analysis (13th Edition)
Introductory Circuit Analysis (13th Edition)
Electrical Engineering
ISBN:
9780133923605
Author:
Robert L. Boylestad
Publisher:
PEARSON
Delmar's Standard Textbook Of Electricity
Delmar's Standard Textbook Of Electricity
Electrical Engineering
ISBN:
9781337900348
Author:
Stephen L. Herman
Publisher:
Cengage Learning
Programmable Logic Controllers
Programmable Logic Controllers
Electrical Engineering
ISBN:
9780073373843
Author:
Frank D. Petruzella
Publisher:
McGraw-Hill Education
Fundamentals of Electric Circuits
Fundamentals of Electric Circuits
Electrical Engineering
ISBN:
9780078028229
Author:
Charles K Alexander, Matthew Sadiku
Publisher:
McGraw-Hill Education
Electric Circuits. (11th Edition)
Electric Circuits. (11th Edition)
Electrical Engineering
ISBN:
9780134746968
Author:
James W. Nilsson, Susan Riedel
Publisher:
PEARSON
Engineering Electromagnetics
Engineering Electromagnetics
Electrical Engineering
ISBN:
9780078028151
Author:
Hayt, William H. (william Hart), Jr, BUCK, John A.
Publisher:
Mcgraw-hill Education,