A silicon detector contains a photoconductive layer of thickness 1 = 20mm. The refractive index of silicon is 4 and the absorption coefficient (a) of silicon in cm-1 is given by a = 10(7-6000) where I is wavelength in Å. Calculate the wavelength at which the quantum efficiency loss due to penetration through the device is equal to that due to re- flection at the surface
A silicon detector contains a photoconductive layer of thickness 1 = 20mm. The refractive index of silicon is 4 and the absorption coefficient (a) of silicon in cm-1 is given by a = 10(7-6000) where I is wavelength in Å. Calculate the wavelength at which the quantum efficiency loss due to penetration through the device is equal to that due to re- flection at the surface
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(ii) A silicon detector contains a photoconductive layer of thickness 1 = 20mm. The refractive index of silicon is 4 and the absorption coefficient (a) of silicon in cm-1 is given by a = 10(7-6000) where I is wavelength in Å. Calculate the wavelength at which the quantum efficiency loss due to penetration through the device is equal to that due to re- flection at the surface.
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