9. Describe the characteristics and differences between two important micro-analyzing techniques: electron probe X-Ray microanalysis (EPMA) & Auger electron spectroscopy (AES).

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Chapter1: Chemical Foundations
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9. Describe the characteristics and differences between two important micro-analyzing techniques: electron
probe X-Ray microanalysis (EPMA) & Auger electron spectroscopy (AES).
10. Consider an insulated chamber with two equally sized compartments that are separated from each other
by a removable partition. Initially one of the compartments is assumed to be evacuated completely while
the other is filled with a mole of an ideal gas under standard atmospheric conditions. Now consider that
the partition is removed so that the gas can expand to fill the two chambers. (a) Will there be a change in
the temperature of the gas? Explain. (b) Compute the value of the entropy change.
11. Prove that Schottky defect form is n/nexp(-w/kT), where n, is vacant lattice site, no is a crystal
containing atoms, w is creasing a Schottky defect energy
Transcribed Image Text:9. Describe the characteristics and differences between two important micro-analyzing techniques: electron probe X-Ray microanalysis (EPMA) & Auger electron spectroscopy (AES). 10. Consider an insulated chamber with two equally sized compartments that are separated from each other by a removable partition. Initially one of the compartments is assumed to be evacuated completely while the other is filled with a mole of an ideal gas under standard atmospheric conditions. Now consider that the partition is removed so that the gas can expand to fill the two chambers. (a) Will there be a change in the temperature of the gas? Explain. (b) Compute the value of the entropy change. 11. Prove that Schottky defect form is n/nexp(-w/kT), where n, is vacant lattice site, no is a crystal containing atoms, w is creasing a Schottky defect energy
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