7 The diode in the circuit shown in Figure P9.27 is fabricated from silicon, and in = I,(e"D/Vr – 1) where at T = 300 K I, = 250 x 10-12 A kT Vr = - - 26 mV vs = 4.2 V+ 110 cos(@t) w = 377 rad/s R=7 k Determine, using superposition, the DC or Q point current through the diode a. Using the DC offset model for the diode. b. By numerically solving the circuit characteristic (1.e., the DC load-line equation) and the device characteristic (L.e., the diode equation). ip
7 The diode in the circuit shown in Figure P9.27 is fabricated from silicon, and in = I,(e"D/Vr – 1) where at T = 300 K I, = 250 x 10-12 A kT Vr = - - 26 mV vs = 4.2 V+ 110 cos(@t) w = 377 rad/s R=7 k Determine, using superposition, the DC or Q point current through the diode a. Using the DC offset model for the diode. b. By numerically solving the circuit characteristic (1.e., the DC load-line equation) and the device characteristic (L.e., the diode equation). ip
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
Chapter1: Introduction
Section: Chapter Questions
Problem 1P: Visit your local library (at school or home) and describe the extent to which it provides literature...
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Transcribed Image Text:7 The diode in the circuit shown in Figure P9.27 is
fabricated from silicon, and
in = I,(e"D/Vr – 1)
where at T = 300 K
I, = 250 x 10-12 A
kT
Vr = -
- 26 mV
vs = 4.2 V+ 110 cos(@t)
w = 377 rad/s
R=7 k
Determine, using superposition, the DC or Q point
current through the diode
a. Using the DC offset model for the diode.
b. By numerically solving the circuit characteristic
(1.e., the DC load-line equation) and the device
characteristic (L.e., the diode equation).
ip
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