6. An integrated circuit has in one chip a NAND gate, a flip flop, a counter, and a shift register. Each one of these can be individually tested to make sure that it works properly. If any one of these fails to work properly, the entire chip is said to fail the acceptance test and is therefore rejected. Even though they are part of the same chip, each of the four components fails its test independent of failures of the other components. The following are the fail probabilities for the NAND gate, the flip flop, the counter, and the shift register, respectively, 0.05, 0.1, 0.03, 0.12. Treat the testing of the chip as a combined experiment of four separate tests. a) Write out the sample space of this experiment, b) draw the tree diagram associated with this experiment, c) determine the probability that the chip works, d) given that the chip fails, determine the probability that it is only the flip flop that failed
6. An integrated circuit has in one chip a NAND gate, a flip flop, a counter, and a shift register. Each one of these can be individually tested to make sure that it works properly. If any one of these fails to work properly, the entire chip is said to fail the acceptance test and is therefore rejected. Even though they are part of the same chip, each of the four components fails its test independent of failures of the other components. The following are the fail probabilities for the NAND gate, the flip flop, the counter, and the shift register, respectively, 0.05, 0.1, 0.03, 0.12. Treat the testing of the chip as a combined experiment of four separate tests. a) Write out the sample space of this experiment, b) draw the tree diagram associated with this experiment, c) determine the probability that the chip works, d) given that the chip fails, determine the probability that it is only the flip flop that failed
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
Chapter1: Introduction
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![6. An integrated circuit has in one chip a NAND gate, a flip flop, a counter, and a shift
register. Each one of these can be individually tested to make sure that it works properly. If
any one of these fails to work properly, the entire chip is said to fail the acceptance test and is
therefore rejected. Even though they are part of the same chip, each of the four components
fails its test independent of failures of the other components. The following are the fail
probabilities for the NAND gate, the flip flop, the counter, and the shift register, respectively,
0.05, 0.1, 0.03, 0.12. Treat the testing of the chip as a combined experiment of four separate
tests. a) Write out the sample space of this experiment, b) draw the tree diagram associated
with this experiment, c) determine the probability that the chip works, d) given that the chip
fails, determine the probability that it is only the flip flop that failed](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2F13de0a7e-c371-4908-81da-1ae806e885cd%2F3fffe9c3-1005-4092-99d4-bb659d635371%2Feszwbj9_processed.png&w=3840&q=75)
Transcribed Image Text:6. An integrated circuit has in one chip a NAND gate, a flip flop, a counter, and a shift
register. Each one of these can be individually tested to make sure that it works properly. If
any one of these fails to work properly, the entire chip is said to fail the acceptance test and is
therefore rejected. Even though they are part of the same chip, each of the four components
fails its test independent of failures of the other components. The following are the fail
probabilities for the NAND gate, the flip flop, the counter, and the shift register, respectively,
0.05, 0.1, 0.03, 0.12. Treat the testing of the chip as a combined experiment of four separate
tests. a) Write out the sample space of this experiment, b) draw the tree diagram associated
with this experiment, c) determine the probability that the chip works, d) given that the chip
fails, determine the probability that it is only the flip flop that failed
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