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13 Determine the maximum reflectance in the center of the visible spectrum for a high-reflectance stack of high-low index double layers formed using n = 1.38 and nH = 2.6 on a substrate of index 1.52. The layers are of equal optical thickness, corresponding to a quarter-wavelength for light of average wavelength 550 nm. The high-index material is encountered first by the incident light, as in Figure 8. AS- sume normal incidence and stacks of (a) 2; (b) 4; (c) 8 dou- ble layers. %3D %3D

13 Determine the maximum reflectance in the center of the visible spectrum for a high-reflectance stack of high-low index double layers formed using n = 1.38 and nH = 2.6 on a substrate of index 1.52. The layers are of equal optical thickness, corresponding to a quarter-wavelength for light of average wavelength 550 nm. The high-index material is encountered first by the incident light, as in Figure 8. AS- sume normal incidence and stacks of (a) 2; (b) 4; (c) 8 dou- ble layers. %3D %3D

Introductory Circuit Analysis (13th Edition)
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
Chapter1: Introduction
Section: Chapter Questions
Problem 1P: Visit your local library (at school or home) and describe the extent to which it provides literature...
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13 Determine the maximum reflectance in the center of the visible spectrum for a high-reflectance stack of high-low index double layers formed using n = 1.38 and ny = 2.6 on a substrate of index 1.52. The layers are of equal optical thickness, corresponding to a quarter-wavelength for light of average wavelength 550 nm. The high-index material is encountered first by the incident light, as in Figure 8. As- sume normal incidence and stacks of (a) 2; (b) 4; (c) 8 dou- ble layers.
Transcribed Image Text:13 Determine the maximum reflectance in the center of the visible spectrum for a high-reflectance stack of high-low index double layers formed using n = 1.38 and ny = 2.6 on a substrate of index 1.52. The layers are of equal optical thickness, corresponding to a quarter-wavelength for light of average wavelength 550 nm. The high-index material is encountered first by the incident light, as in Figure 8. As- sume normal incidence and stacks of (a) 2; (b) 4; (c) 8 dou- ble layers.
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