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1-WHICH IS THE SENSOR? 2-WHICH IS THE TRANSDUECER? 3-WHAT IS IT USED FOR? 4-IS THERE ANY NOISE IN MEASUREMENT? 5-WHAT IS THE UNCONTROLLABLE VARIBLES? Detector and feedback electronics Laser Photodiodes Cantilever and tip Sample surface *******

1-WHICH IS THE SENSOR? 2-WHICH IS THE TRANSDUECER? 3-WHAT IS IT USED FOR? 4-IS THERE ANY NOISE IN MEASUREMENT? 5-WHAT IS THE UNCONTROLLABLE VARIBLES? Detector and feedback electronics Laser Photodiodes Cantilever and tip Sample surface *******

Elements Of Electromagnetics
Elements Of Electromagnetics
7th Edition
ISBN:9780190698614
Author:Sadiku, Matthew N. O.
Publisher:Sadiku, Matthew N. O.
ChapterMA: Math Assessment
Section: Chapter Questions
Problem 1.1MA
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**Educational Resource: Understanding Measurement Systems** --- ### Measurement System Analysis: Key Questions and Diagram **Here are 5 questions according to the figure:** 1. **Which is the sensor?** 2. **Which is the transducer?** 3. **What is it used for?** 4. **Is there any noise in measurement?** 5. **What are the uncontrollable variables?** --- ### Diagram Explanation The accompanying figure depicts the components of a surface measurement system utilizing atomic force microscopy (AFM): 1. **Detector and Feedback Electronics**: This box represents the electronic system that detects signals and provides feedback to control the measurement process. 2. **Laser**: Positioned to emit a beam directed towards the cantilever and tip. 3. **Photodiodes**: Receive the reflected laser beam and convert optical signals into electrical signals. 4. **Cantilever and Tip**: The cantilever bends or deflects as it scans the sample surface structure. 5. **Sample Surface**: The unknown and varied surface being measured. **Detailed Description of Components and Functionality:** - **Laser**: Generates and directs a beam towards the cantilever. Its deflection is crucial for measurement. - **Cantilever and Tip**: This component physically interacts with the sample surface. As the tip scans over the surface features, the cantilever bends accordingly. - **Photodiodes**: Positioned to gather the reflected laser beam from the cantilever. It detects changes in the beam’s position caused by the bending of the cantilever. - **Detector and Feedback Electronics**: This system processes the signal received from the photodiodes and adjusts the position of the cantilever to maintain constant interaction with the sample surface. **Measurement Use and Considerations:** - **Usage**: This system is primarily used for high-resolution imaging and measuring the surface characteristics of materials at a nanoscale level. - **Noise in Measurement**: Yes, there can be noise in the measurement, such as thermal noise, electronic noise in the detection system, and noise due to vibrations. - **Uncontrollable Variables**: Variables such as environmental vibrations, temperature fluctuations, and drift in electronic components can introduce uncertainties in measurement accuracy. --- **Conclusion:** This system highlights the intricate interplay between components to accurately measure surface topographies, despite the presence of noise and uncontrollable variables. Understanding each part’s role is critical for optimizing measurements in atomic force microscopy applications.
Transcribed Image Text:**Educational Resource: Understanding Measurement Systems** --- ### Measurement System Analysis: Key Questions and Diagram **Here are 5 questions according to the figure:** 1. **Which is the sensor?** 2. **Which is the transducer?** 3. **What is it used for?** 4. **Is there any noise in measurement?** 5. **What are the uncontrollable variables?** --- ### Diagram Explanation The accompanying figure depicts the components of a surface measurement system utilizing atomic force microscopy (AFM): 1. **Detector and Feedback Electronics**: This box represents the electronic system that detects signals and provides feedback to control the measurement process. 2. **Laser**: Positioned to emit a beam directed towards the cantilever and tip. 3. **Photodiodes**: Receive the reflected laser beam and convert optical signals into electrical signals. 4. **Cantilever and Tip**: The cantilever bends or deflects as it scans the sample surface structure. 5. **Sample Surface**: The unknown and varied surface being measured. **Detailed Description of Components and Functionality:** - **Laser**: Generates and directs a beam towards the cantilever. Its deflection is crucial for measurement. - **Cantilever and Tip**: This component physically interacts with the sample surface. As the tip scans over the surface features, the cantilever bends accordingly. - **Photodiodes**: Positioned to gather the reflected laser beam from the cantilever. It detects changes in the beam’s position caused by the bending of the cantilever. - **Detector and Feedback Electronics**: This system processes the signal received from the photodiodes and adjusts the position of the cantilever to maintain constant interaction with the sample surface. **Measurement Use and Considerations:** - **Usage**: This system is primarily used for high-resolution imaging and measuring the surface characteristics of materials at a nanoscale level. - **Noise in Measurement**: Yes, there can be noise in the measurement, such as thermal noise, electronic noise in the detection system, and noise due to vibrations. - **Uncontrollable Variables**: Variables such as environmental vibrations, temperature fluctuations, and drift in electronic components can introduce uncertainties in measurement accuracy. --- **Conclusion:** This system highlights the intricate interplay between components to accurately measure surface topographies, despite the presence of noise and uncontrollable variables. Understanding each part’s role is critical for optimizing measurements in atomic force microscopy applications.
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