Chapter 35, Problem 52P

41 through 52 GO 43, 51 SSM 47, 51 Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r₁ and r₂ interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-2 refers to the indexes of refraction n₁, n₂, and n₃, the type of interference, the thin-layer thickness L in nanometers, and the wavelength λ in nanometers of the light as measured in air. Where λ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated.

Figure 35-42 Problems 41 through 52

	n1	n2	n3	Type	L	λ
52	1.32	1.75	1.39	max	325