Question-1 The Table given below presents the thickness of a metal layer on 50 silicon wafers resulting from a chemical vapor deposition (CVD) process in a semiconductor. Construct relative frequency histogram for these data. Comment on the results? 438 487 451 441 461 471 435 472 433 454 413 430 437 459 453 458 474 455 466 448 444 440 444 458 430 445 454 459 435 428 468 450 453 454 438 463 471 423 432 478 445 456 434 437 445 455 441 434 423 449

A First Course in Probability (10th Edition)
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ISBN:9780134753119
Author:Sheldon Ross
Publisher:Sheldon Ross
Chapter1: Combinatorial Analysis
Section: Chapter Questions
Problem 1.1P: a. How many different 7-place license plates are possible if the first 2 places are for letters and...
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Question-1
The Table given below presents the thickness of a metal layer on 50 silicon wafers resulting from a chemical
vapor deposition (CVD) process in a semiconductor. Construct relative frequency histogram for these data.
Comment on the results?
438
435
487 451
441
471 472 433
454
461
453 458 474
413
430
437 459
455
448
466
444 440
444 458
430
445
435 428
454 459
468
450
453
454
438
463
471
423
432
478
445 456 434
437 445 423 449 455 441
434
Transcribed Image Text:Question-1 The Table given below presents the thickness of a metal layer on 50 silicon wafers resulting from a chemical vapor deposition (CVD) process in a semiconductor. Construct relative frequency histogram for these data. Comment on the results? 438 435 487 451 441 471 472 433 454 461 453 458 474 413 430 437 459 455 448 466 444 440 444 458 430 445 435 428 454 459 468 450 453 454 438 463 471 423 432 478 445 456 434 437 445 423 449 455 441 434
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